How to get Ppk per parameter and Cpk per wafer per parameter post outlier filtering?
I have put together the following JSL to first filter the outliers in the data and then get the Ppk, but I note that my script is incorrect as when I filter the outliers by excluding all rows, I exclude non-outliers data points for other process parameters. For defining outliers, my preferred criteria is anything outside Q1/Q3 +/- 1.5xIQR is an outlier, which is what (I think) I use below.Names D
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