How to best fit data to a plane or line
HelloI was wondering if there is a way in JMP that I could use to take raw data of multiple measurement points (each with an X, Y, Z component) and best fit this data to form a best fit plane. Basically my intent is to take raw metrology data off of OMMs/CMMs and fit them myself without the use of CMM/OMMs measurement software.Thanks for your help!