How to get process parameter yield by wafer in a lot?
I want to get process parameter yield per "Wafer ID in lot ID" from the sample data table "Semiconductor Capability.jmp". However, I am not able to proceed as I am getting an error: "Process Screening requires at least 7 rows of data."
Names Default To Here (1);
clear log ();
dt = Open("$SAMPLE_DATA/Semiconductor Capability.jmp");
col_names = dt << Get Column Group("Processes");
ps = dt << Proc
...