Application-based Empirical Modeling of Semiconductor Circuit Reliability (2026-US-30MP-2921)
With aggressive technology scaling and novel device architectures in modern semiconductor technologies, it has become challenging to make input/output (I/O) transistors that can support higher voltages (e.g., 3.3 V). However, I/O operation at higher voltages is needed to allow the chip to communicate with other devices on the board, which may have been fabricated with older-generation technologies ...
Skill level:
intermediate