Mehul Shroff is a Fellow and Six Sigma Black Belt at NXP Semiconductors, primarily focused on advanced-CMOS and NVM reliability. He has over 30 years of experience in the semiconductor industry. His prior experience includes process integration and device engineering in manufacturing and R&D, yield engineering, and test vehicles and test structures. His current interests are focused on reliability tools and methodologies, design for reliability, and data science and machine learning for quality and reliability.
