Mehul Shroff is a Fellow and Six Sigma Black Belt at NXP Semiconductors in Austin, TX, with over 29 years of experience in the semiconductor industry. His current interests are focused on reliability tools and methodologies, design for reliability, and data science and machine learning for quality and reliability. His prior experience includes process integration and device engineering in manufacturing, technology transfer, and development, module development, yield engineering, and test vehicles and test structures.
