Anyone with experience with JMP modeling reliabilitty growth with various development phases, various sample sizes and various test times and where not all failures have an engineering fix but are instead repaired.
I'd appreciate any white papers or comments.
Here is a link to the Overview section of the documentation for Reliability Growth in JMP:
You could also check out some of the references in the documentation, specifically:
Crow, L. H., (1975), “Reliability Analysis for Complex, Repairable Systems,” AMSAA Technical Report No. 138, Dec. 1975, U.S. Army Materiel Systems Analysis Activity, Aberdeen Proving Ground, MD.
Crow, L. H., (1982), “Confidence Interval Procedures for the Weibull Process with Applications to Reliability Growth,” Technometrics, Feb. 1982, 24:1, 67-72.
MIL-HDBK-00189 (1981), Military Handbook: Reliability Growth Management, U.S. Department of Defense, Washington DC.