Hey! If you stack your data so that the different tests are in one column and the result in a second (Test and Bin in the attached data table). You can use the Semiconductor toolkit to generate these figures:
![MikeD_Anderson_0-1623944709514.png MikeD_Anderson_0-1623944709514.png](https://community.jmp.com/t5/image/serverpage/image-id/33642i5CB9AEC3518417DC/image-size/medium?v=v2&px=400)
using these settings:
![MikeD_Anderson_1-1623944744628.png MikeD_Anderson_1-1623944744628.png](https://community.jmp.com/t5/image/serverpage/image-id/33643i7F4EC636E84AAF94/image-size/medium?v=v2&px=400)
In the Patterned Wafer Map Tool
Best,
M