Subscribe Bookmark RSS Feed
M_Anderson

Staff

Joined:

Nov 21, 2014

Semiconductor Toolkit

A NEW YEAR WILL BRING A NEW VERSION!

 

I've started working on a new version of the toolkit, taking into consideration some of the feedback below.  I'd like to hear from those using the toolkit about things they would like to see tweaked, fixed, or added.  PM me on the community or add a comment below if you'd like to give some feedback on improvements!

 

Best,

 

M

 

 

 

THE SEMICONDUCTOR TOOLKIT
The Semiconductor Toolkit is an attempt to answer the need from the semiconductor industry for specialized visualizations and reframing of existing JMP capabilities.  On its initial release, the toolkit contains tools for generating patterned and unpatterned wafer maps, annotating existing graphics with wafer geometry, and a semiconductor specific frontend to the Hierarchical Clustering with spatial measures option.  The toolkit is intended to be a collaborative and living effort by interested parties.  Constructive criticism, bug reports, and capability suggestions are welcome and encouraged. 

wafer map.jpg

SYSTEM REQUIREMENTS
The add-in is for version 12 and newer of JMP and JMP Pro.  The add-in will check which version of JMP it is being added to and show only the methods available on that installation.

 

UPDATES

  • (2016-11-03) Corrected bugs found by @ragnarl.
  • (2016-10-14)  Added a note about the next release to correspond with the launch of the new community site
  • (2016-09-26)  Added screenshots and descriptions for each tool.

 
THE TOOLS

Annotate Existing Plot adds markers for the wafer and exclusion edges to an existing graph or series of graphs in the same window.  If the die geometry is known, markers for the die layout can also be added.


Cluster Defects is a front end for the Hierarchical Clustering Platform with the spatial measures option used.  This front end recasts the general terms used in the Hierarchical Clustering Platform into terms that are more familiar to the semiconductor industry.

 

Create Bare Wafer Map uses coordinate information and a response variable to create a bare wafer map.  The tool provides information about the quality fo the fit for the smoothing algorithm used.  The tool currently supports Neural Network models - one type in JMP and two types in JMP Pro.  

 

Wafer Map Generator creates Shape Files for JMP to use in the Graph Builder Platform.  Due to the differences in IT policy, the files are generated on the user's Desktop and it is left to the user to move these files to the correct location in the file system.  These locations can be found on page 308 in the JMP 13 book "Essential Graphing."  This book is included in the JMP install and can be found under Help > Books > Essential Graphing in JMP. 

 

Wafer Map from Shot Table creates Shape Files for JMP to use in the Graph Builder Platform as with the Wafer Map Generator.  This tool uses a table of coordinates (upper left corner and die center are currently supported) to generate the map.

Comments
ragnarl

Thanks Michael for sharing this very promising add-in!

At this point I have only tried the wafer map generator. It works well for the default die dimensions, but it fails when the X and/or Y dimensions are odd or fractions. For example, try with X Dimension = 25.81, Y Dimension = 15.21.

Also, the X and Y axis have wrong increment settings.

The fixes are simple:

To fix the issue with the odd / fraction die dimensions:

In MakeMainWindow, Change the definition xMax and yMax:

//xMaX = (2 * wRad) / xSize;
//yMax = (2 * wRad) / ySize;
xMax = 2 * Ceiling(wRad / xSize);
yMax = 2 * Ceiling(wRad / ySize);

To fix the problem with the axis increments.:

Use ySize for axisbox(1) and xSize for axisbox(2):

toolWin[Axisbox( 1 )] << Show Major Grid( 1 ) << Inc(ySize);

toolWin[Axisbox( 2 )] << Show Major Grid( 1 )<< Inc(xSize);

Lars-Åke Ragnarsson

imec

ragnarl

Suggestions for improvement in this tool:

  • Add notch to wafer
  • Add notch location (e.g. bottom, right, ...)
M_Anderson

Lars,

Thanks for the feedback!  I can't seem to generate a failure with odd sized dimensions like you describe.  I'd like to get some more information about what you're experiencing.  Can you send me an email at mike.anderson[at]jmp.com, please?

Thanks!

M

M_Anderson

Thanks for these improvement suggestions.  I agree with you and I'll get them into the next revision.

best,

M

vmuriart

fyi, Looks like the images have dissapeared ofter the migration

M_Anderson

Yes, I was in a hurry to get the new version up, so I didn't bother with the images.  I'll get them back up soon.  

 

Best,

 

 

mhamblin

Does anyone know of a consultant / firm who offers custom development work of JMP solutions for fabless semiconductor companies?  We are interested in using it, but would like someone with more experience to help us develop / deploy the solution.  Thanks!

@mhamblin, check JMP.com/partners for a list of firms that can help you. Lots of good choices.