how to use JMP to calculate Lot to Lot, Wafer to Wafer, Within wafer variation?
My question is how to use JMP to calculate Lot to Lot, Wafer to Wafer, Within wafer variation and quantify the uniformity?for example, I have one table, in this table have column "lot", column "wafer", column "site", also includes one data column.within same lot have 15 wafers, within same wafer have 20 sites, so the question is how to use JMP to calculate Lot to Lot, Wafer to Wafer, Within wafer ...