Prioritization of Yield Detractors
Besides the question is in spec(value) --- for a single parameter.
If there are several parameters with spec limits there could be sets with multiple spec violation (fail A, fail A+B , fail A + K ... fail K, pass) ... is there a possibility to define a prioritization of yield detractors in JMP? device 1 failed due to spec A - subsequent spec's do not have to be tested anymore.
-> In total x% of th...