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CorinneBerges
Level IV
Public Statistics
| Date Registered | ‎01-30-2017 10:00 AM |
| Date Last Visited | ‎02-24-2025 07:33 AM |
| Total Messages Posted | 9 |
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| Date Last Visited |
‎02-24-2025
07:33 AM
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Latest posts by CorinneBerges
Subject Views Posted 409 ‎05-21-2024 04:49 PM 839 ‎05-20-2024 04:10 PM 369 ‎05-17-2024 02:08 PM 372 ‎03-25-2024 01:27 PM 0 ‎12-11-2023 09:37 PM 0 ‎12-11-2023 09:37 PM 0 ‎12-11-2023 09:37 PM 0 ‎12-11-2023 09:36 PM 0 ‎12-11-2023 09:36 PM 243 ‎12-11-2023 09:36 PM -
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Activity Feed for CorinneBerges
- Tagged Corinne Bergès on Speakers. ‎03-28-2025 07:42 AM
- Tagged Corinne Bergès on Speakers. ‎03-24-2025 03:22 PM
- Tagged Yield and Quality Issue Solving by Correlating Optical Inspection Step Results With Electrical Tests (2023-EU-PO-1343) on Abstracts. ‎02-02-2025 04:13 PM
- Tagged Yield Loss Issue for an RFFE Product: Data Analytics and Machine Learning for Root Cause Searching (2022-EU-PO-960) on Abstracts. ‎02-02-2025 04:10 PM
- Tagged Root Cause Failure Analysis in the Semiconductor Industry Using Data Analytics and Machine Learning (2021-EU-PO-738) on Abstracts. ‎02-02-2025 04:07 PM
- Tagged NXP Structured Problem-Solving Approach: Two Case Studies in Semiconductor Test and Design for Automotive (2020-EU-EPO-384) on Abstracts. ‎02-02-2025 04:05 PM
- Tagged Corinne Bergès on Speakers. ‎02-02-2025 02:46 PM
- Tagged Corinne Bergès on Speakers. ‎02-02-2025 02:24 PM
- Tagged Corinne Bergès on Speakers. ‎02-02-2025 02:24 PM
- Tagged NXP Structured Problem-Solving Approach: Two Case Studies in Semiconductor Test and Design for Automotive (2020-EU-EPO-384) on Abstracts. ‎01-28-2025 05:11 PM
- Tagged Root Cause Failure Analysis in the Semiconductor Industry Using Data Analytics and Machine Learning (2021-EU-PO-738) on Abstracts. ‎01-28-2025 03:29 PM
- Tagged Root Cause Failure Analysis in the Semiconductor Industry Using Data Analytics and Machine Learning (2021-EU-PO-738) on Abstracts. ‎01-28-2025 03:29 PM
- Tagged Yield Loss Issue for an RFFE Product: Data Analytics and Machine Learning for Root Cause Searching (2022-EU-PO-960) on Abstracts. ‎01-28-2025 02:54 PM
- Tagged Yield and Quality Issue Solving by Correlating Optical Inspection Step Results With Electrical Tests (2023-EU-PO-1343) on Abstracts. ‎01-28-2025 02:10 PM
- Posted NXP Structured Problem-Solving Approach: Two Case Studies in Semiconductor Test and Design for Automotive (2020-EU-EPO-384) on Abstracts. ‎05-21-2024 04:49 PM
- Tagged NXP Structured Problem-Solving Approach: Two Case Studies in Semiconductor Test and Design for Automotive (2020-EU-EPO-384) on Abstracts. ‎05-21-2024 04:49 PM
- Posted Root Cause Failure Analysis in the Semiconductor Industry Using Data Analytics and Machine Learning (2021-EU-PO-738) on Abstracts. ‎05-20-2024 04:10 PM
- Tagged Root Cause Failure Analysis in the Semiconductor Industry Using Data Analytics and Machine Learning (2021-EU-PO-738) on Abstracts. ‎05-20-2024 04:10 PM
- Posted Yield Loss Issue for an RFFE Product: Data Analytics and Machine Learning for Root Cause Searching (2022-EU-PO-960) on Abstracts. ‎05-17-2024 02:08 PM
- Tagged Yield Loss Issue for an RFFE Product: Data Analytics and Machine Learning for Root Cause Searching (2022-EU-PO-960) on Abstracts. ‎05-17-2024 02:08 PM
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