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Semiconductor JMP Users Group Discussions

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maria_astals
Staff maria_astals
Staff

Discovery Summit Europe Poster: Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts

May 8, 2026 08:35 AM (176 views)

Dear Community, I would like to share this very interesting poster presented at Discovery Summit Europe. 

Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts 

This poster is about tracking how long wafers – the thin slices of material used to build chips – spend inside a piece of equipment during a specific manufacturing step. Essentially, we're monitoring the equipment's process time.

Here the link: https://community.jmp.com/t5/Abstracts/Detecting-Sudden-Process-Time-Variations-in-a-Semicon-Fab-usi...

Other interesting presentations can be found here: https://community.jmp.com/t5/Abstracts/eb-p/abstracts?tags=Europe,2026

 

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