Dear Community, I would like to share this very interesting poster presented at Discovery Summit Europe.
Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts
This poster is about tracking how long wafers – the thin slices of material used to build chips – spend inside a piece of equipment during a specific manufacturing step. Essentially, we're monitoring the equipment's process time.
Here the link: https://community.jmp.com/t5/Abstracts/Detecting-Sudden-Process-Time-Variations-in-a-Semicon-Fab-usi...
Other interesting presentations can be found here: https://community.jmp.com/t5/Abstracts/eb-p/abstracts?tags=Europe,2026
