Semiconductor Community

New features or bug fixes that help one user in one area might also help other users in the same area. So I thought about creating a list of feature requests with a focus on Semiconductor. Let's join forces to get them implemented as soon as possible : ) the idea: a link - and maybe a short motivation here to keep the list "slim", if you have any comments, please follow the link and comment in the original post   ... View more

Dear Community, I would like to share this very interesting poster presented at Discovery Summit Europe.  Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts  This poster is about tracking how long wafers – the thin slices of material used to build chips – spend inside a piece of equipment during a specific manufacturing step. Essentially, we're monitoring the equipment's process time. Here the link: https://community.jmp.com/t5/Abstracts/Detecting-Sudden-Process-Time-Variations-in-a-Semicon-Fab-using/ec-p/916583#M2319 Other interesting presentations can be found here: https://community.jmp.com/t5/Abstracts/eb-p/abstracts?tags=Europe,2026   ... View more

The STDF Reader Add-In imports Standard Test Data Format (STDF V4) binary files into JMP, converting raw semiconductor test data into a file summary and six structured data tables https://marketplace.jmp.com/appdetails/STDF+Reader   Launch the add-in from the JMP Add-Ins menu and provide two inputs: the path to your STDF file and an output directory for intermediate files. The add-in handles the rest — it parses the binary file via Python, generates JMP data tables with appropriate column properties (including USL/LSL spec limits), and builds a JMP Project containing all data tables and analysis reports. Use the Column Switcher in the control chart report to navigate between tests, the Local Data Filter in the wafer map to select individual wafers, and the Process Screening report to identify underperforming tests at a glance. ... View more

NXP's Citizen Data Scientist Program is an initiative that delivers both statistical training and tangible results – like eliminating more than 100 tests without losing reliability coverage – to the business. In this video, Mehul Shroff, Technical Director for Intrinsic/Radiation Reliability at NXP, explains how statistical approaches in place at NXP mean cost reduction doesn't come at a cost to quality.   ... View more

For decades, testing was limited to 2% of total manufacturing costs with highly advanced automated test equipment capable of performing several different tests at the same time on multiple chips or wafers, and ultimately for different functions as part of system-level testing. Today, these testing percentages are on the rise again.  Based on run-on-error data and test time data, it is easy to obtain the optimal test order in term of test duration. By plotting a curve of test coverage over time, it is possible to study how to further reduce test duration while quantifying the impact on quality. https://marketplace.jmp.com/appdetails/Test+Time+Optimizer    With this add‑in, engineers can: - Reduce overall test time by identifying low‑value or redundant steps - Lower manufacturing costs through smarter test strategy decisions - Visualize the Test Coverage vs. Time curve to clearly see tradeoffs and optimization opportunities - Make data‑driven decisions with an intuitive JMP interface If improving throughput and efficiency is a priority for your team, this tool can make a measurable impact.   ... View more