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Semiconductor JMP Users Group Discussions

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Why NXP can reduce testing costs while delivering on high quality & reliability standards: Customer Success Story

NXP's Citizen Data Scientist Program is an initiative that delivers both statistical training and tangible results – like eliminating more than 100 tests without losing reliability coverage – to the business.

In this video, Mehul Shroff, Technical Director for Intrinsic/Radiation Reliability at NXP, explains how statistical approaches in place at NXP mean cost reduction doesn't come at a cost to quality.

 

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