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Semiconductor JMP Users Group Events

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Webinar: From Defect to Root Cause: Making Sense of Semiconductor Data

Presented in English
Published on ‎10-28-2026 04:53 AM by Staff

JMP is teaming up with Physics Today and Wiley for a webinar featuring two speakers with firsthand semiconductor industry experience.
Lisa Daroque and Christian Zollner will share insights from their work in the industry, using a real-life case study to show how data analysis can help trace a fab defect to its potential root cause.

Registration: From Defect to Root Cause: Making Sense of Semiconductor Data

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Start:
Wed, Nov 4, 2026 09:00 AM EST
End:
Wed, Nov 4, 2026 10:00 AM EST
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