Michael Anderson, PhD, JMP Systems Engineer, SAS
Wafer Maps: Those colorful representations of a response over an entire substrate. Wafer maps are ubiquitous in most branches of semiconductor manufacturing and research. They are churned out with the click of a button by most industry-specific software. They delight managers and strike fear in the hearts of competitors. The problem is, most of the time, they are wrong. . . or at least misleading. This presentation will demonstrate how to generate
a wafer map in JMP using a Neural Network model. Along the way, it will discuss some of then pitfalls of using wafer maps and explore how JMP can facilitate a more nuanced interpretation of these figures.
