I'm creating a summary table for some data whereby a group of wafers were tested more than once. The data is messy regarding which test iteration a particular parameter was measured. I want the ultimate table to record only the earliest instance of the test for each wafer/die. I have a retest iteration column in the table I can use as a subgroup on the table but I don't know how to use that to make the collapse to earliest. The image below shows a wafer/die combination that tested 4 times. The parameter of interest was tested on iteration2 and 3 for some and iteration 3 and 4 for another.
Hi, If you're looking for a ready-to-use solution, there's a short tutorial on Retest Algorithm of YieldOptiX that shows how to extract the earliest test (or similar operations) without scripting