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Neo
Neo
Level VI

How to get Ppk per parameter and Cpk per wafer per parameter post outlier filtering?

I have put together the following JSL to first filter the outliers in the data and then get the Ppk, but I note that my script is incorrect as when I filter the outliers by excluding all rows, I exclude non-outliers data points for other process parameters.  

For defining outliers, my preferred criteria is anything outside Q1/Q3 +/- 1.5xIQR is an outlier, which is what (I think) I use below.

Names Default To Here (1);
Clear Log ();
dt = Open( "$SAMPLE_DATA/Semiconductor Capability.jmp" );
col_names = dt << Get Column Group("Processes"); // Column Group should pre-exist. 
obj = Explore Outliers(Y(Eval( col_names ) )); // Run expolore outliers 
obj << Quantile Range Outliers( Tail Quantile( 0.25 ), Q (1.5) ); // select Q3/Q1 +/- 1.5 x IQR
obj << Exclude Rows(ALL); // exclude OL rows

// Run capability analysis
platform = dt << Process Capability(
	Process Variables( Eval( col_names ) ),
	Spec Limits Dialog( "No (skip columns with no spec limits)" ),
	Moving Range Method( Average of Moving Ranges ),
	Overall Sigma Summary Report( 1 ),
	//Spec Limits Dialog( "No (skip columns with no spec limits)" ),
	Select Out of Spec Values( 1 ),
	Goal Plot(0 ),
	Capability Index Plot( 1 ),
	Process Performance Plot( 0 ),
	Order By( "Within Sigma Ppk Ascending" )
);
Wait( 0 );
Report( platform )[Outline Box( "Process Capability" )][Outline Box( "Overall Sigma Capability Summary Report" )][Table Box( 1 )] <<
Make Into Data Table;
dt_curr = Current Data Table();
dt_curr << Set Name( "Capability Report" );

I can colour outlier cells per parameter but do not know how to exclude them for Capability Analysis. I need some help here.

 

Secondly, for each wafer in a lot, I would like to calculate the Cpk for each process parameter after outlier filtering,  to get a Cpk trend plot by wafer for each process parameter. How to do this via JSL (using the example data set I have got in my script)?

When it's too good to be true, it's neither
22 REPLIES 22
Neo
Neo
Level VI

Re: How to get Ppk per parameter and Cpk per wafer per parameter post outlier filtering?

@jthi Yes, Thanks.  Found the enable label setting in my JMP 16. 

My second question how to change the y-axis title for all charts (via "Page") to something common (Say "Capability") via JSL? 

When it's too good to be true, it's neither
jthi
Super User

Re: How to get Ppk per parameter and Cpk per wafer per parameter post outlier filtering?

I would go with XPath and try to find correct references. This might not work in all of the cases and it might require some adjusting

Names Default To Here(1); 

dt = open("$SAMPLE_DATA/Big Class.jmp");

gb = dt << Graph Builder(
	Size(528, 2954),
	Show Control Panel(0),
	Variables(X(:height), Y(:weight), Page(:age)),
	Elements(Points(X, Y, Legend(15)), Smoother(X, Y, Legend(16)))
);

tebs = Report(gb) << XPath("//TextEditBox");
tebs[4::N Items(tebs)::2] << Set Text("Capability");
-Jarmo
Neo
Neo
Level VI

Re: How to get Ppk per parameter and Cpk per wafer per parameter post outlier filtering?

@jthi. Thanks.  I have instead opted for Wrap which works for what I need the chart for. In this case there is only one y-axis to worry about which I can handle on JSL. 

When it's too good to be true, it's neither