cancel
Showing results for 
Show  only  | Search instead for 
Did you mean: 
  • DownloadSemiconductor Toolkit: Tools to create wafer maps, add wafer geometry to graphics, explore die defects & compare wafers.
  • Discovery Summit 2026: Early User Edition - September 23-24.Register. It's free.
  • Use JMP Clinical with CDISC-compliant data. Review studies, ID safety and efficacy signals & communicate findings with interactive graphics. Register to see how. Aug. 27, 2 pm US ET.

Discussions

Solve problems, and share tips and tricks with other JMP users.
Choose Language Hide Translation Bar
Rily_Maya
Level III

A question regarding reliability growth in concurrent systems

May I ask:

Why do the results in Table VI on page 83 of MIL-HDBK-189C, "Department of Defense Handbook Reliability Growth Management", differ from the results analyzed by JMP?

1 ACCEPTED SOLUTION

Accepted Solutions
peng_liu
Level VII

Re: A question regarding reliability growth in concurrent systems

Why F = 45? Should it be 27?

I believe that we debated it during development. And concluded the handbook is wrong.

View solution in original post

3 REPLIES 3
Rily_Maya
Level III

Re: A question regarding reliability growth in concurrent systems

 
Rily_Maya
Level III

Re: A question regarding reliability growth in concurrent systems

TABLE VI.png

peng_liu
Level VII

Re: A question regarding reliability growth in concurrent systems

Why F = 45? Should it be 27?

I believe that we debated it during development. And concluded the handbook is wrong.

Recommended Articles