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Virtual-metrology script

What inspired this wish list request? Please describe the current issue that needs improvement or the problem to be solved that is not easy or possible right now, with an example use case. 

Semiconductor industry need the virtal metrology but less researchers and manager have not understand the importance of virtual metrology. Thus I woyld like to requset JMP to have script to run virtual-metrology.

 

 

What is the improvement you would like to see? Please describe the idea for improving JMP. Please include mock-ups, wireframes, screenshots, scripts, other documents or examples from other software that help describe the change you would like to see. 

Yield analysis engineer and process engineer use JUMP to improve yiled and improve the controllability of process tool based on JUMP.

 

 

Why is this idea important? Please describe the value to you and/or other users if the idea is implemented (for example, ease of use, must have,…).vast impact on semiconductor industory to lower the cost of the product by improving yield.

 

 

1 Comment
SarahGilyard
Staff
Status changed to: Acknowledged

Thank you for posting NKodama. Virtual Metrology involves building models to predict wafer properties from tool settings and sensor data. JMP can already build many types of predictive models that can be used in the virtual metrology use-case. Are there specific types of models you had in mind or you would like to see those models built into a platform that uses semiconductor specific language/references?