In the final post of this series, we see the last bits of JMP Chief Data Scientist Chris Gotwalt’s interview with world-renowned reliability expert, William Q. Meeker, Professor of Statistics and Distinguished Professor of Liberal Arts at Iowa State University. The first post touched on “proactive reliability” and how machine learning, IoT, and Industry 4.0 have implications for maintenance and improved reliability. The second post explored overlapping disciplines and foundational contributions of statistics, as well as the evolution of statistics education. The third post examined the growing importance of Bayesian methods.
The interview complemented the plenary talk Bill recorded for the 2021 Discovery Summit Japan. This blog series features sections of Chris’ interview to shine light on Bill’s many contributions to statistics, as well as two recent books he has co-authored: Achieving Product Reliability: A Key to Business Success, with Necip Doganaksoy and Gerald J. Hahn; and the second edition of Statistical Methods for Reliability Data, which Bill co-authored with Luis A. Escobar and Francis G. Pascual. We are pleased to offer the first chapter of Achieving Product Reliability.
We have had a long and fruitful collaboration with Bill, adding new methods for reliability analysis into JMP software. We are grateful for his many contributions to statistics and working with us to incorporate new and better methods to enable better product reliability.
In the first clip, Bill reveals his motivation for writing the book on statistical intervals.
Here, Bill shares an interesting exchange he had with W. Edwards Deming.
You can see the entire interview, as well as Bill’s plenary talk at Discovery Summit Japan from November 2021, here in the JMP Community.
