This is the second blog post in a series that highlights portions of JMP Chief Data Scientist Chris Gotwalt’s interview with award-winning and widely published reliability expert William Q. Meeker, Professor of Statistics and Distinguished Professor of Liberal Arts at Iowa State University. The first post touched on “proactive reliability” and how machine learning, IoT, and Industry 4.0 have implications for maintenance and improved reliability.
The interview complemented Bill’s 2021 Discovery Summit Japan plenary talk. This blog series features sections of Chris’ interview to share Bill’s many contributions to statistics, as well as two recent books he co-authored: Achieving Product Reliability: A Key to Business Success, with Necip Doganaksoy and Gerald J. Hahn; and the second edition of Statistical Methods for Reliability Data, which Bill co-authored with Luis A. Escobar and Francis G. Pascual. You can download the first chapter of Achieving Product Reliability.
Chris has worked closely with Bill over the years to incorporate new methods for reliability analysis into JMP software. We are grateful to have this collaborative relationship with Bill to enable better product reliability.
In this first clip, taking into account how the emergence of data science and other disciplines overlaps with statistics, Bill explains how statistics is at the core of disciplines seeking to make sense of data and how many statistical concepts are foundational contributions.
In the next clip, Bill predicts the likely evolution of statistics education — from the new methods that will need to be covered to the older materials that may no longer be as relevant.
In the next post, Bill delves into the importance of Bayesian methods and their growing use.
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