Currently have a license for JMP 19 (non-pro). My group's current process is to run an import script when a metrology tool produces output for a lot. Output data usually has Lot Number and Wafer ID. The data is concatenated to a table with previous measurements, our SPC Table. The user then has to manual update row values for columns in the SPC Table that track process details like Process Tool, Etch Time, etc.
Is there a way to avoid manual entry of process details in my SPC Table if I have a Process Details table that has these values recorded on a Lot and Wafer ID basis? Ideally, as soon as the new metrology data is concatenated to the SPC Table, the Process Details values for that Lot and Wafer ID are updated.
