Prioritization of Yield Detractors

[#1]

Besides the question is in spec(value) --- for a single parameter.
If there are several parameters with spec limits there could be sets  with multiple spec violation (fail A, fail A+B , fail A + K ... fail K, pass) ... is there a possibility to define a prioritization of yield detractors in JMP?

device 1 failed due to spec A - subsequent spec's do not have to be tested anymore.
->  In total x% of the devices fail due to (prioritized) spec A.

...

device 2 failed due to spec K - subsequent spec's do not have to be tested anymore. 
-> In total x% of the devices fail due to less prioritized spec K - but no higher-prio spec.

...

device 3 fulfills all specs -> pass.

[#2]

Thanks. True...Distribution does give some nice ways at looking at things (and one can still add a filter(s)). I was thinking Graph builder incase there were other ways one might want to slice up the graph like by lot or other fab or other characteristic of the unit(s) bringing explored