Hi,
I am trying to do wafer map defect analysis very similar to that shown here:
Image and wafer analysis using functional data analysis (jmp.com)
I am able to use FDE in the same way to plot FPCs similar to their plot.
What's the next step for modelling this and identifying which wafers are likely to have certain features?
Hi, David!
That blog was for a fairly early iteration of FDE. With the current version, you could potentially include supplementary variables when you set up the analysis to do some modeling.
You'd still have to export things to visualize it.
Best,
M