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Neo
Neo
Level VI

How to get Pareto/Histogram plot for failing parameters when using Process Capability platform?

I use the the example script below to select and color the out of spec values of each measured parameter in my test data set.

I want to create a pareto/histogram plot with measured parameter names (on x-axis) and number of fail occurrences (on y axis) per parameter and order the parameter names as decreasing with no of fails/parameter (i.e. to get a parameter fail pareto plot). 

The first thing comes to mind is to get the number of selected/colored cells per parameter generated by the script below and then proceed from there. How to do this via JSL?

Process Capability(
	Process Variables( :NPN1, :PNP1, :PNP2 ),
	Moving Range Method( Average of Moving Ranges ),
	Overall Sigma Normalized Box Plots( 1 ),
	Color Out of Spec Values( 1 ),
	Select Out of Spec Values( 1 ),
	Goal Plot( 1 ),
	Capability Index Plot( 1 ),
	Process Performance Plot( 0 )
);

 

When it's too good to be true, it's neither
1 ACCEPTED SOLUTION

Accepted Solutions
jthi
Super User

Re: How to get Pareto/Histogram plot for failing parameters when using Process Capability platform?

Using Process Capability might be easier as it provides Out of Spec Count and it can also color the cells

jthi_0-1698256507532.png

 

Edit:

Hide/Close platforms tables as needed

Names Default To Here(1);

dt = Open("$SAMPLE_DATA/Semiconductor Capability.jmp");

ps = dt << Process Screening(
	Process Variables(:NPN1, :PNP1, :PNP2),
	Control Chart Type("Indiv and MR"),
);
ps << Color Out of Spec Values(1); // this will also select rows and columns
dt << Clear Select << Clear Column Selection;

dt_ps = Report(ps)["Process Screening", Table Box(1)] << Make Combined Data Table;
// ps << Close Window;

gb_outofspec = dt_ps << Graph Builder(
	Size(528, 450),
	Show Control Panel(0),
	Variables(
		X(
			:Column,
			Order By(:Out of Spec Count, Descending, Order Statistic("Mean"))
		),
		Y(:Out of Spec Count)
	),
	Elements(Bar(X, Y, Legend(9), Label("Label by Value")))
);
-Jarmo

View solution in original post

2 REPLIES 2
jthi
Super User

Re: How to get Pareto/Histogram plot for failing parameters when using Process Capability platform?

Using Process Capability might be easier as it provides Out of Spec Count and it can also color the cells

jthi_0-1698256507532.png

 

Edit:

Hide/Close platforms tables as needed

Names Default To Here(1);

dt = Open("$SAMPLE_DATA/Semiconductor Capability.jmp");

ps = dt << Process Screening(
	Process Variables(:NPN1, :PNP1, :PNP2),
	Control Chart Type("Indiv and MR"),
);
ps << Color Out of Spec Values(1); // this will also select rows and columns
dt << Clear Select << Clear Column Selection;

dt_ps = Report(ps)["Process Screening", Table Box(1)] << Make Combined Data Table;
// ps << Close Window;

gb_outofspec = dt_ps << Graph Builder(
	Size(528, 450),
	Show Control Panel(0),
	Variables(
		X(
			:Column,
			Order By(:Out of Spec Count, Descending, Order Statistic("Mean"))
		),
		Y(:Out of Spec Count)
	),
	Elements(Bar(X, Y, Legend(9), Label("Label by Value")))
);
-Jarmo
SDF1
Super User

Re: How to get Pareto/Histogram plot for failing parameters when using Process Capability platform?

Hi @Neo ,

 

  I think going with @jthi 's suggestion to do a Process Screening might be a good way to go about getting a parameter fail pareto plot. From there, you can do a <<Make Into Data Table from the Process Screening Report, and as an example, you can do a Pareto Plot of the Out of Spec Count -- or whichever column is the one that is most interest to you.

 

  The script below is pretty much just a direct save script to Scripting Window action at each step. A few extra things have been thrown in there, but this is essentially what you're interested in, at least as far as I understand your request.

Names Default to Here(1);

dt = Open("$SAMPLE_DATA/Semiconductor Capability.jmp");

ps = dt<<Process Screening(
	Process Variables( :NPN1, :PNP1, :PNP2, :NPN2, :PNP3 ),
	Control Chart Type( "Indiv and MR" )
);

rpt = New Window( "Semiconductor Capability - Process Screening",
	Data Table( "Semiconductor Capability" ) <<
	Process Screening(
		Process Variables( :NPN1, :PNP1, :PNP2, :NPN2, :PNP3 ),
		Control Chart Type( "Indiv and MR" )
	)
);

ps << Close Window;

pdt = rpt["Process Screening", Table Box( 1 )] << Make Into Data Table;

rpt << Close Window;

pp = pdt<<Pareto Plot( Cause( :Column ), Freq( :Out of Spec Count ) );

Hope this helps!,

DS