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  • JMP Security Notice: CVE-2026-109618 and CVE-2026-109619

    JMP promptly initiated a review of its products, services, and relevant infrastructure for exposure to CVE-2026-109618 and CVE-2026-109619.

    Our assessment of JMP products has not identified exposure to these vulnerabilities. Where remediation was required within supporting environments, appropriate security updates and controls have been applied and validated.

    We have identified no evidence of successful exploitation or unauthorized access to JMP systems or customer information associated with these vulnerabilities.

    JMP continues to monitor the issue and relevant vendor guidance. No action is required by JMP customers at this time.

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Semiconductor JMP Users Group Discussions

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How JSR Micro Boosted Quality & Efficiency with Advanced Analytics

I’m sharing this success story from JSR Micro because it’s a strong example of how the right analytics strategy can create measurable impact in semiconductor manufacturing.

In this case, JSR Micro streamlined its quality control and production analytics by integrating multiple data sources using solutions from JMP. Faced with disconnected production, QC, and environmental datasets, the team consolidated information to enable faster, more reliable insights — reducing batch review time from 15 minutes to just 5 minutes, and saving more than 10 working days annually.

Even more importantly, they can now identify out-of-spec conditions earlier, helping prevent downstream reliability risks and strengthening customer confidence. It’s a great illustration of how structured data access and statistical tools can drive both operational efficiency and proactive quality improvement in semiconductor materials production.

Check out the full story here: https://www.jmp.com/en/customer-stories/jsr-micro

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