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Phil Kay's Blog

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Understanding Complex Yield Issues with Sensor Data - 5 Minute Case Study
Created: Nov 27, 2018 04:19 PM

See how you can increase yields by finding complex and subtle causes of defects from in-process sensor data. In this case study very small differences in the process variable ramp rates were found to be responsible for an expensive yield problem.

 

(view in My Videos)

Last Modified: Nov 30, 2018 10:31 AM