Dr. Peng Liu, a Reliability R&D Expert at JMP, has been invited (thanks Jay!) as a guest speaker by the IEEE Boston/Providence/New Hampshire Reliability Chapter to present next Wednesday February 24th at 11 a.m. ET. Dr. Liu is responsible for developing and maintaining JMP’s platforms for reliability and survival data analysis, reliability engineering, and time series analysis.
Dr. Liu’s talk, “JMP Reliability Platforms – A Zoom In Then Zoom Out Introduction”, will feature a live demonstration of warranty forecasting as well as Bayesian modeling capability of analyzing accelerated life test data, including various use cases that reliability professionals utilize to ensure products continue to function as intended, generating happy customers.
Please join us by registering with the IEEE via this link. Invite your colleagues as well!
