cancel
Showing results for 
Show  only  | Search instead for 
Did you mean: 

Practice JMP using these webinar videos and resources. We hold live Mastering JMP Zoom webinars with Q&A most Fridays at 2 pm US Eastern Time.See the list and register. Local-language live Zoom webinars occur in the UK, Western Europe and Asia. See your country jmp.com/mastering site.

%3CLINGO-SUB%20id%3D%22lingo-sub-312406%22%20slang%3D%22en-US%22%20mode%3D%22NONE%22%3EFehler%20erkennen%20und%20reduzieren%3C%2FLINGO-SUB%3E%3CLINGO-BODY%20id%3D%22lingo-body-312406%22%20slang%3D%22en-US%22%20mode%3D%22NONE%22%3E%0A%3CP%3E%26nbsp%3B%3C%2FP%3E%0A%3CP%3E%3CIFRAME%20src%3D%22https%3A%2F%2Fplayers.brightcove.net%2F1872491364001%2Fdefault_default%2Findex.html%3FvideoId%3D4931537979001%22%20width%3D%22300%22%20height%3D%22150%22%20allowfullscreen%3D%22allowfullscreen%22%20webkitallowfullscreen%3D%22webkitallowfullscreen%22%20class%3D%22video%20floatRight%22%20mozallowfullscreen%3D%22mozallowfullscreen%22%3E%3C%2FIFRAME%3E%3C%2FP%3E%0A%3CP%3EErfahren%20Sie%2C%20wie%20Sie%3A%3C%2FP%3E%0A%3CUL%3E%0A%3CLI%3E%3CSPAN%3EReduzieren%20Sie%20r%C3%A4umliche%20Fehlerdaten%20auf%20einige%20wenige%20Schl%C3%BCsselcluster%3C%2FSPAN%3E%3C%2FLI%3E%0A%3CLI%3E%3CSPAN%3E%3CSPAN%3EOrdnen%20Sie%20Cluster%20und%20isolierte%20Fehler%20dem%20Herstellungsprozess%20zu%2C%20um%20eine%20Richtung%20f%C3%BCr%20Prozessverbesserungen%20vorzugeben%3C%2FSPAN%3E%3C%2FSPAN%3E%3C%2FLI%3E%0A%3C%2FUL%3E%0A%3CP%3E%26nbsp%3B%3C%2FP%3E%0A%3CP%3E%3CIFRAME%20src%3D%22https%3A%2F%2Fplayers.brightcove.net%2F1872491364001%2Fdefault_default%2Findex.html%3FvideoId%3D4931563365001%22%20width%3D%22300%22%20height%3D%22150%22%20allowfullscreen%3D%22allowfullscreen%22%20webkitallowfullscreen%3D%22webkitallowfullscreen%22%20class%3D%22video%20floatRight%22%20mozallowfullscreen%3D%22mozallowfullscreen%22%20data-mce-fragment%3D%221%22%3E%3C%2FIFRAME%3E%3C%2FP%3E%0A%3CP%3EErfahren%20Sie%2C%20wie%20Sie%3A%3C%2FP%3E%0A%3CUL%3E%0A%3CLI%3E%3CSPAN%3EUntersuchen%20Sie%20mehrdimensionale%20Fehler%2C%20indem%20Sie%20von%20einer%202D-%20zu%20einer%203D-Ansicht%20des%20Fehlers%20wechseln%3C%2FSPAN%3E%3C%2FLI%3E%0A%3CLI%3E%3CSPAN%3EErkunden%20Sie%203D-Ansichten%20visuell%20mit%20Scatterplot%203D%3C%2FSPAN%3E%3C%2FLI%3E%0A%3C%2FUL%3E%3CSPAN%3E%3C%2FSPAN%3E%3CSPAN%3ERessourcen%3C%2FSPAN%3E%3CUL%20class%3D%22list-arrow%22%3E%0A%3CLI%3E%3CA%20title%3D%22Videos%20zu%20multivariater%20Analyse%20und%20Clustering%22%20href%3D%22https%3A%2F%2Fwww.jmp.com%2Fen_us%2Fevents%2Fondemand%2Fmastering-jmp%2Fmultivariariate-data-exploration.html%22%20target%3D%22_blank%22%20rel%3D%22noopener%20noreferrer%22%3EClustering%20von%20Videos%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%20href%3D%22https%3A%2F%2Fwww.jmp.com%2Fen_us%2Fevents%2Fondemand%2Fmastering-jmp%2Fmultivariariate-data-exploration.html%22%20target%3D%22_blank%22%20rel%3D%22noopener%20noreferrer%22%3EMultivariate%20Analyse-%20und%20Clustering-Videos%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%20title%3D%22Hintergrundinformationen%20zur%20Merkmalsextraktionstechnik%20der%20Hough-Transformation%22%20href%3D%22https%3A%2F%2Fen.wikipedia.org%2Fwiki%2FHough_transform%22%20target%3D%22_blank%22%20rel%3D%22noopener%20nofollow%20noreferrer%22%3EHintergrundinformationen%20zur%20Merkmalsextraktionstechnik%20der%20Hough-Transformation%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%20href%3D%22https%3A%2F%2Fcommunity.jmp.com%2Fdocs%2FDOC-10285%23comment-7421%22%20target%3D%22_blank%22%3EJMP%20Semiconductor%20Tool%20Kit%20Add-In%20zum%20Erstellen%20von%20Waferkarten%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%3EVideo%20des%20Discovery%20Summit%3A%20Alle%20Waferkarten%20sind%20falsch%3A%20Ein%20Abenteuer%20in%20der%20Halbleiterdatenvisualisierung%3C%2FA%3E%3C%2FLI%3E%0A%3C%2FUL%3E%0A%3C%2FLINGO-BODY%3E%3CLINGO-LABS%20id%3D%22lingo-labs-312406%22%20slang%3D%22en-US%22%20mode%3D%22NONE%22%3E%3CLINGO-LABEL%3EQualit%C3%A4ts-%20und%20Verfahrenstechnik%3C%2FLINGO-LABEL%3E%3C%2FLINGO-LABS%3E
Choose Language Hide Translation Bar
Pinpointing and Reducing Defects

 

See how to:

  • Reduce spatial defect data to a few key clusters
  • Correlate clusters and isolated defects to the manufacturing process in order to give direction for process improvements

 

See how to:

  • Examine multildimensional defects by going from a 2D to a 3D view of the defect
  • Visually explore 3D views using Scatterplot 3D
 Resources

Recommended Articles