cancel
Showing results for 
Show  only  | Search instead for 
Did you mean: 
JMP is taking Discovery online, April 16 and 18. Register today and join us for interactive sessions featuring popular presentation topics, networking, and discussions with the experts.
Submit your abstract to the call for content for Discovery Summit Americas by April 23. Selected abstracts will be presented at Discovery Summit, Oct. 21- 24.

Practice JMP using these webinar videos and resources. We hold live Mastering JMP Zoom webinars with Q&A most Fridays at 2 pm US Eastern Time. See the list and register. Local-language live Zoom webinars occur in the UK, Western Europe and Asia. See your country jmp.com/mastering site.

%3CLINGO-SUB%20id%3D%22lingo-sub-312406%22%20slang%3D%22en-US%22%20mode%3D%22NONE%22%3EIdentifier%20et%20r%C3%A9duire%20les%20d%C3%A9fauts%3C%2FLINGO-SUB%3E%3CLINGO-BODY%20id%3D%22lingo-body-312406%22%20slang%3D%22en-US%22%20mode%3D%22NONE%22%3E%0A%3CP%3E%26nbsp%3B%3C%2FP%3E%0A%3CP%3E%3CIFRAME%20src%3D%22https%3A%2F%2Fplayers.brightcove.net%2F1872491364001%2Fdefault_default%2Findex.html%3FvideoId%3D4931537979001%22%20width%3D%22300%22%20height%3D%22150%22%20allowfullscreen%3D%22allowfullscreen%22%20webkitallowfullscreen%3D%22webkitallowfullscreen%22%20class%3D%22video%20floatRight%22%20mozallowfullscreen%3D%22mozallowfullscreen%22%3E%3C%2FIFRAME%3E%3C%2FP%3E%0A%3CP%3ED%C3%A9couvrez%20comment%26nbsp%3B%3A%3C%2FP%3E%0A%3CUL%3E%0A%3CLI%3E%3CSPAN%3ER%C3%A9duisez%20les%20donn%C3%A9es%20de%20d%C3%A9fauts%20spatiaux%20%C3%A0%20quelques%20clusters%20cl%C3%A9s%3C%2FSPAN%3E%3C%2FLI%3E%0A%3CLI%3E%3CSPAN%3E%3CSPAN%3ECorr%C3%A9ler%20les%20clusters%20et%20les%20d%C3%A9fauts%20isol%C3%A9s%20avec%20le%20processus%20de%20fabrication%20afin%20de%20donner%20une%20orientation%20aux%20am%C3%A9liorations%20du%20processus%3C%2FSPAN%3E%3C%2FSPAN%3E%3C%2FLI%3E%0A%3C%2FUL%3E%0A%3CP%3E%26nbsp%3B%3C%2FP%3E%0A%3CP%3E%3CIFRAME%20src%3D%22https%3A%2F%2Fplayers.brightcove.net%2F1872491364001%2Fdefault_default%2Findex.html%3FvideoId%3D4931563365001%22%20width%3D%22300%22%20height%3D%22150%22%20allowfullscreen%3D%22allowfullscreen%22%20webkitallowfullscreen%3D%22webkitallowfullscreen%22%20class%3D%22video%20floatRight%22%20mozallowfullscreen%3D%22mozallowfullscreen%22%20data-mce-fragment%3D%221%22%3E%3C%2FIFRAME%3E%3C%2FP%3E%0A%3CP%3ED%C3%A9couvrez%20comment%26nbsp%3B%3A%3C%2FP%3E%0A%3CUL%3E%0A%3CLI%3E%3CSPAN%3EExaminer%20les%20d%C3%A9fauts%20multidimensionnels%20en%20passant%20d'une%20vue%202D%20%C3%A0%20une%20vue%203D%20du%20d%C3%A9faut%3C%2FSPAN%3E%3C%2FLI%3E%0A%3CLI%3E%3CSPAN%3EExplorez%20visuellement%20les%20vues%203D%20%C3%A0%20l'aide%20de%20Scatterplot%203D%3C%2FSPAN%3E%3C%2FLI%3E%0A%3C%2FUL%3E%3CSPAN%3E%3C%2FSPAN%3E%3CSPAN%3ERessources%3C%2FSPAN%3E%3CUL%20class%3D%22list-arrow%22%3E%0A%3CLI%3E%3CA%20title%3D%22Vid%C3%A9os%20sur%20l'analyse%20multivari%C3%A9e%20et%20le%20clustering%22%20href%3D%22https%3A%2F%2Fwww.jmp.com%2Fen_us%2Fevents%2Fondemand%2Fmastering-jmp%2Fmultivariariate-data-exploration.html%22%20target%3D%22_blank%22%20rel%3D%22noopener%20noreferrer%22%3EVid%C3%A9os%20de%20clustering%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%20href%3D%22https%3A%2F%2Fwww.jmp.com%2Fen_us%2Fevents%2Fondemand%2Fmastering-jmp%2Fmultivariariate-data-exploration.html%22%20target%3D%22_blank%22%20rel%3D%22noopener%20noreferrer%22%3EVid%C3%A9os%20d'analyse%20multivari%C3%A9e%20et%20de%20clustering%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%20title%3D%22Contexte%20de%20la%20technique%20d'extraction%20de%20caract%C3%A9ristiques%20de%20transformation%20de%20Hough%22%20href%3D%22https%3A%2F%2Fen.wikipedia.org%2Fwiki%2FHough_transform%22%20target%3D%22_blank%22%20rel%3D%22noopener%20nofollow%20noreferrer%22%3EContexte%20de%20la%20technique%20d'extraction%20de%20caract%C3%A9ristiques%20de%20transformation%20de%20Hough%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%20href%3D%22https%3A%2F%2Fcommunity.jmp.com%2Fdocs%2FDOC-10285%23comment-7421%22%20target%3D%22_blank%22%3ECompl%C3%A9ment%20JMP%20Semiconductor%20Tool%20Kit%20pour%20cr%C3%A9er%20des%20cartes%20de%20tranches%3C%2FA%3E%3C%2FLI%3E%0A%3CLI%3E%3CA%3EVid%C3%A9o%20du%20Discovery%20Summit%26nbsp%3B%3A%20Toutes%20les%20cartes%20de%20plaquettes%20sont%20fausses%26nbsp%3B%3A%20une%20aventure%20dans%20la%20visualisation%20des%20donn%C3%A9es%20sur%20les%20semi-conducteurs%3C%2FA%3E%3C%2FLI%3E%0A%3C%2FUL%3E%0A%3C%2FLINGO-BODY%3E%3CLINGO-LABS%20id%3D%22lingo-labs-312406%22%20slang%3D%22en-US%22%20mode%3D%22NONE%22%3E%3CLINGO-LABEL%3EIng%C3%A9nierie%20Qualit%C3%A9%20et%20Proc%C3%A9d%C3%A9s%3C%2FLINGO-LABEL%3E%3C%2FLINGO-LABS%3E
Choose Language Hide Translation Bar
Pinpointing and Reducing Defects

 

See how to:

  • Reduce spatial defect data to a few key clusters
  • Correlate clusters and isolated defects to the manufacturing process in order to give direction for process improvements

 

See how to:

  • Examine multildimensional defects by going from a 2D to a 3D view of the defect
  • Visually explore 3D views using Scatterplot 3D
 Resources

Recommended Articles