How Can I use JMP for Statistical Process Control (SPC) for Semiconductors?

JMP is useful for SPC in all industries, including this example for semiconductors.

See how to:

Understand process shifts and add alarms
Screening multiple parameters for stability (Process Screening)
Filter to find important factors (Predictor Screening) and determine their capability
Monitor multiple parameters in one control chart through Model Driven Multivariate Control Chart to ID the underlying components that lead to out-of-control signals

Recommended Articles