Learn JMP

Quality and Process Engineering

• Jump into Gauge Studies

  Jump into Gauge Studies Date:  Wednesday, October 15
  Time: 1:00 – 2:30 p.m. ET
  Duration: 90 minutes
  Registration: FREE   Hosted via Zoom   This online workshop is designed for intermediate to advanced users with at least one year of JMP experience who would like to dive deeper into quality. Attendees learn the basics of measurement system analysis. If you have any questions about this event, please c...

  KirstenCrannell

  Learn JMP Events |

  Wednesday, October 15, 2025
  Oct 15

• Jump into Control Charting

  Jump into Control Charting Date:  Wednesday, December 3
  Time: 1:00 – 2:30 p.m. ET
  Duration: 90 minutes
  Registration: FREE   Hosted via Zoom   This online workshop is designed for intermediate to advanced users with at least one year of JMP experience who would like to dive deeper into quality. Attendees learn the basics of statistical process control. If you have any questions about this event, pleas...

  KirstenCrannell

  Learn JMP Events |

  Wednesday, December 3, 2025
  Dec 3

• MSA Attribute Data

  Use to evaluate the performance of a categorical based measurement system (e.g.,  pass or fail, classification of parts into multiple categories, ordinal ratings). This analysis is often used to assess the ability of observers (appraisers) to correctly and consistently classify inspected items. Attribute Measurement Systems Analysis Select Analyze > Quality and Process > Variability / Attribute G...

  gail_massari

  Learning Library |

  Aug 21, 2025 5:20 PM

  94 views | 0 replies

• MSA Continuous Data – EMP Method

  This guide provides instructions on performing a measurement system analysis (MSA) using the EMP (Evaluating the Measurement Process) method. This analysis is designed to evaluate and certify the performance of a measurement system that produces continuous data. Measurement Systems Analysis: EMP Method Select Analyze > Quality and Process > Measurement System Analysis.Click on a continuous variab...

  gail_massari

  Learning Library |

  Aug 21, 2025 5:07 PM

  105 views | 0 replies

• MSA Continuous Data – Gauge R&R

  This guide provides instructions on creating a variability chart and performing a gauge R&R (Repeatability and Reproducibility) measurement system analysis (MSA). This analysis is designed to evaluate and certify the performance of a measurement system that produces continuous data. For information on using the EMP (Evaluating the Measurement Process) method, see the MSA Continuous Data – EMP Meth...

  gail_massari

  Learning Library |

  Aug 21, 2025 5:03 PM

  254 views | 0 replies

• Capability Analysis for Multiple Responses

  This guide provides instructions on performing a process capability analysis for multiple continuous process variables simultaneously. This platform produces a set of reports and graphs that are designed to compare the performance of the different process variables to each other.    The Capability Analysis Dialog                                                                               From a...

  gail_massari

  Learning Library |

  Aug 21, 2025 4:57 PM

  94 views | 0 replies

• Process Capability Analysis

  This guide provides instructions on performing a capability analysis using the Distribution and Control Chart platforms. A process capability analysis is used to evaluate the performance of a process for a continuous variable to specifications (Lower and/or upper specification limit, and/or target). See Capability Analysis for Multiple Responses guide for performing process capability analyses on ...

  gail_massari

  Learning Library |

  Aug 21, 2025 4:54 PM

  152 views | 0 replies

• Tolerance Interval

  Use to produce an interval estimated to contain a specified proportion of a population. Tolerance Interval for Proportion (Normal Distribution) From an open JMP data table, select Analyze > Distribution.Select one or more continuous variables from Select Columns, click Y, Columns (continuous variables have blue triangles), and click OK.From the Distributions report window, select Tolerance Interv...

  gail_massari

  Learning Library |

  Aug 21, 2025 4:49 PM

  87 views | 0 replies

• Attribute Control Charts – C and U Charts

  This guide provides instructions on creating C and U attribute control charts. C charts are often used to plot the number of nonconformities (or defects) in a subgroup that usually, but not necessarily, consists of one inspection unit, while U charts are often used to plot the number of nonconformities per unit, where the number of units per subgroup can vary.     C Charts From an open JMP^® data ...

  gail_massari

  Learning Library |

  Aug 21, 2025 4:39 PM

  94 views | 0 replies

• Variables Control Charts – XBar & R/S Charts

  This guide provides instructions for creating XBar & R or XBar & S control charts using the Control Chart Builder and the Control Chart platform. XBar & R or XBar & S control charts are used to monitor a continuous variable where the data is sampled with subgroups.    XBar & R Charts – Control Chart Builder From an open JMP^® data table, select Analyze > Quality and Process > Control Chart Builder....

  gail_massari

  Learning Library |

  Aug 21, 2025 3:23 PM

  54 views | 0 replies

• Attribute Control Charts – P and NP Charts

  This guide provides instructions on creating P and NP attribute control charts. P charts are often used to plot the proportion of nonconforming (defective) items per subgroup, while NP charts are often used to plot the number of nonconforming items p er subgroup. P Charts From an open JMP^® data table, select Analyze > Quality and Process > Control Chart > P Control ChartSelect one or more continu...

  gail_massari

  Learning Library |

  Aug 21, 2025 12:56 PM

  83 views | 0 replies

• Variables Control Charts – XBar & R/S Charts

  This guide provides instructions for creating XBar & R or XBar & S control charts using the Control Chart Builder and the Control Chart platform. XBar & R or XBar & S control charts are used to monitor a continuous variable where the data is sampled with subgroups.  XBar & R Charts – Control Chart Builder From an open JMP^® data table, select Analyze > Quality and Process > Control Chart Builder.D...

  gail_massari

  Learning Library |

  Aug 21, 2025 12:51 PM

  76 views | 0 replies

• Variables Control Charts – I/MR Charts

  This guide provides instructions for creating I & MR (Individuals and Moving Range) control charts using the Control Chart Builder and the Control Chart platform. I/MR control charts are used to monitor a continuous variable where the data is sampled without subgroups. I/MR Charts – Control Chart Builder From an open JMP^® data table, select Analyze > Quality and Process > Control Chart Builder.Dr...

  gail_massari

  Learning Library |

  Aug 21, 2025 12:05 PM

  84 views | 0 replies

• Introduction to Quality Methods

  (view in My Videos)

  DonMcCormack

  Learning Center |

  Jul 29, 2025 3:34 PM

  186 views | 0 replies

• Pinpointing Problem Sources in Complex Manufacturing Processes

  Video using JMP 18 was posted in July 2025. Do you have a complex manufacturing process with many steps and tools that could contribute to poor yield or reduced quality? Do you have historical data about your yields that is tedious or time consuming to analyze and understand? Are you tasked with applying your understanding of your tools and processes to improve future yields?  Are you facing prod...

  gail_massari

  Learn JMP Events |

  Friday, July 18, 2025

• JMPによる測定システム分析（MSA）（日本語）

  測定システム分析（MSA）について、考え方や概念とともに、JMPでの操作方法、結果の見方などを解説したセミナーです。ゲージR&RやEMP分析、測定システム計画分析、バイアスと直線性などについて、JMPのデモとともに紹介しています。   ※本セミナーは、動画作成時点での最新バージョン「JMP 18.2.1」を使用しています。 ※プレゼン資料（Power Point）、Part 4で使用したデータは、本ページからダウンロードできます。   目次 Part 1. イントロダクション Part 2. 測定システム分析：ゲージR&Rにおける交差モデルと枝分かれモデル Part 3. EMP分析 Part 4. 実施例：測定システム分析計画から分析まで Part 5. バイアスと直線性   Part 1. イントロダクション（7分0秒） とりあえずゲージR&Rを実施してみるこの後のパートで説明すること...

  Masukawa_Nao

  Learn JMP Events |

  Monday, June 23, 2025

• Getting Insight into Your Process Stability, Quality and Capability

  Video using JMP 18 was posted in June 2025.     Do you need to identify routine (common-cause) and abnormal (special cause) process variation over time? Are you tasked with comparing how well  a process is performing compared to its given spec limits or after a process is changed? Are you responsible for understanding stability and capability metrics for a large number of processes across time?  ...

  gail_massari

  Learn JMP Events |

  Friday, June 13, 2025

• JMP for Teaching Statistics in Semiconductor Engineering Education

      Get JMP software free for academic use at jmp.com/student   Semiconductor engineering is a data intensive process. Engineers need to visualize and analyze vast amounts of data to improve yield, identify and rectify drifts or failures, monitor process health, and more. JMP statistical software, used widely in the semiconductor industry, is a strong tool for teaching students in semiconductor ...

  Ross_Metusalem

  Learn JMP Events |

  Thursday, April 17, 2025

• JMP for Teaching Statistics in Chemistry and Chemical Engineering

    Get JMP software free for academic use at jmp.com/student   The American Chemical Society’s guidelines on undergraduate chemistry education recommend that students learn to “analyze data with appropriate statistical methods and software.” JMP statistical software, used widely in the chemical industry, can help students master statistical methods through a no-code, graph-first interface.   This ...

  Ross_Metusalem

  Learn JMP Events |

  Thursday, March 6, 2025

• Getting a Handle on Optimizing Day-to-Day Process Manufacturing Operations - Mastering JMP

  Video was recorded in January 2025 using JMP 18.   Are you a manufacturing engineer who supports day-to-day operations?  Do you need to launch an effort to understand and optimize your process, but don’t know where to start? Would you like a straightforward way to visually summarize and explore your manufacturing data and then dig into process capability and root-cause analysis to help improve the...

  gail_massari

  Learn JMP Events |

  Friday, January 31, 2025

• Academic Webinar – Teaching Statistical Quality Control

    Get JMP software free for academic use at jmp.com/student   Modern industrial processes can be very complex and require use of statistical quality control (SQC) methods for monitoring process behavior and maintaining outputs within specification. For many engineering students, learning SQC methods is central to preparing for the challenges they will face in their careers. This webinar demonstra...

  Ross_Metusalem

  Learn JMP Events |

  Wednesday, November 20, 2024

• JMPによる管理図の作成（日本語）

  JMPは、以前のバージョンから管理図を描く機能が充実しており、近年のバージョンアップでもその機能は拡張されています。 本動画シリーズでは、JMPで管理図を作成するための基本操作から、計量値の管理図、計数値の管理図の特徴や作成方法について説明します。   本動画の操作は、JMPのサンプルデータで試すことができます。 サンプルデータは、JMPのメニューバーから [ヘルプ] > [サンプルの索引] を選択し、サンプルデータ名を検索することにより検索することができます。   ※本動画は、動画作成時点の最新バージョン（JMP 18.0.1）を用いています。   Part 1. JMPで管理図を作成するための基本操作Section 1.JMPで管理図を作成する2つの方法（8分46秒）Section 2. 管理図のテスト、オプション設定（10分25秒）Part 2. 計量値の管理図（11分56秒）Par...

  Masukawa_Nao

  Learn JMP Events |

  Tuesday, July 30, 2024

• 半導体業界で役立つ！ 統計解析ソフトウェア「JMP」の機能と活用例

  半導体業界（素材、製造装置も含む）では、研究開発、品質・信頼性管理、製造、検査の各フェーズで活用できるJMPの機能があります。本動画では、JMPの概要や半導体業界での利用事例を紹介し、データ解析および統計解析におけるJMPの機能とその活用例についてデモンストレーションを交えて紹介します。最後にJMPを活用するためのリソースも紹介しています。半導体業界向けの事例の紹介、データ例になっていますが、製造業（電子部品、自動車、半導体以外の素材など）の研究、品質管理、製造などに従事されている方でも役立つ内容になっています。     ※本動画、資料は、製作時点（2024年6月）での最新バージョン「JMP（JMP Pro）18.0.1」を用いています。 ※このページから、セミナーで使用した資料（pdf）をダウンロードできます。   目次 はじめに. JMPの概要と半導体業界での利用トピック1: 多数の...

  Ryan_Gilmore

  Learn JMP Events |

  Monday, June 17, 2024

• New in JMP 18 and JMP Pro 18

  JMP 18 and JMP Pro 18 offer many new capabilities .  See a video of some of the key new capabilites and download the Journal to try some of the techniques yourself in JMP 18. Note, for several capabilites you will need JMP Pro 18.    Watch the whole video below, or click on titles in the bullet list to see only the segments on the topic in the list. (view in My Videos)   See how to use: New capabi...

  gail_massari

  Learn JMP Events |

  Tuesday, June 4, 2024

• 「JMP 18」 業務で役立つ新機能 　～分析、グラフ編（日本語）～

  本ページでは、2024年4月にリリースした最新バージョン「JMP 18」の新機能を動画にて紹介します。   分析、グラフ、実験計画法に対する新機能、Pythonインテグレーション、ヘルプメニューの改良について、項目ごとにショート動画としてまとめています。目次から興味がある項目を選択して動画をご覧ください。   目次 分析、グラフ1. 「グラフビルダー」のアップデート　（7分5秒）2. 「モデルのあてはめ」のアップデート　（4分27秒）3. 「曲線のあてはめ」のアップデート　（6分1秒）4. PR曲線　（6分57秒）5. Cohenのd統計量　（3分12秒）6. 同等性の検定のアップデート（3分31秒）7. Jonckheere-Tepstra検定（3分6秒）8. 片側Dunnett検定（1分52秒）9. Friedman順位検定の多重比較（2分3秒）10. 短期操業管理図（4分50秒）11...

  Ryan_Gilmore

  Learn JMP Events |

  Sunday, June 2, 2024