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Pinpointing and Reducing Defects

Presented in English
Published on ‎11-07-2024 03:29 PM by Community Manager Community Manager | Updated on ‎04-08-2025 09:12 AM

See how to:

  • Reduce spatial defect data to a few key clusters
  • Correlate clusters and isolated defects to the manufacturing process in order to give direction for process improvements

See how to:

  • Examine multildimensional defects by going from a 2D to a 3D view of the defect
  • Visually explore 3D views using Scatterplot 3D
Resources

Start:
Thu, Sep 24, 2020 02:00 PM EDT
End:
Thu, Sep 24, 2020 03:00 PM EDT
Attachments
Mastering JMP Spatial Defects.pptx
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