Accelerated Life Testing (ALT) is required to evaluate product reliability for parts that need to perform well for long periods.  Due to low failure rates at use conditions, parts must be tested at high stress levels in order to generate failures in a reasonable amount of time. Devices requiring such reliability analyses include medical devices, semiconductor circuits, aviation equipment and more. See how to analyze accelerated test data to predict lifetimes at use conditions for both single and multiple constant stresses tests, along with ramped stress tests.  A safe operating area using contour plots will also be described.      

This webinar covers: Fit Life by X, Parametric Survival, Step Stress.

Suggested Prerequisites: Learning Library -  Accelerated Life Testing (Fit Life by X)