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Try the Materials Informatics Toolkit, which is designed to easily handle SMILES data. This and other helpful add-ins are available in the JMP® Marketplace
Quality Corner: Statistical Process Control

 

In the inaugural installment of JMP On Air’s new series, Quality Corner, Systems Engineer Alisa Hunt-Lowery introduces you to concept of Statistical Process Control (SPC). With JMP, you can easily measure variation and assess your measurement system. Using an example of driving your car into a garage, Alisa shares how JMP can help you asses the process capability and help you determine if your process can meet your specifications. Alissa also discusses control charts, what type to use (for both continuous and discrete data) and how to create control charts in JMP to see if your process is in statistical control.