Israel JMP Users - קבוצת משתמשים - ישראל

Hi everyone, I’m running a Functional Data Analysis (FDA) in JMP, and I would like to automate the process across 34 iterations. In each iteration, I want to: Exclude one specific defect (each time a different one) as the validation set. Fit the FDA model on the remaining data. Extract the FPCA Summariesfrom each model automatically. In other words, I want to perform a kind of leave-one-defect-out validation for my FDA, and collect the FPCA summaries for each of the 34 runs. Is there a way to script this process in JMP (using JSL or another tool)? If so, could you please share an example or point me to relevant documentation? Thanks in advance! ... View more

(DOE to MSA) John Linden, Research Physicist, KLA ... View more

Talk during the Israel Users Group 2025.  Guy Burshtein, Senior R&D Engineer at SCD ... View more

Bayesian Optimization, aka BayesOpt, is a new platform coming to JMP Pro 19. With it, you can use your existing data to fit a model and then use that model to intelligently decide where to sample next. These new observations are used to update the model and find even better samples. This process can start with a minimal number of runs, which means wasting fewer resources on suboptimal samples and spending more time exploring new opportunities.  More resources:  - Developer Tutorial: https://community.jmp.com/t5/Learn-JMP-Events/Developer-Tutorial-Bayesian-Optimization/ev-p/894910 - JMP Cable Article: https://community.jmp.com/t5/JMPer-Cable/Introducing-the-Bayesian-Optimization-platform-in-JMP-Pro/ba-p/897807   ... View more

We’re excited to share that the Israel Online JMP Users Group meeting has been rescheduled to November 4th!    Same great agenda, just a new date! Join us for insightful presentations, user stories, and the latest updates from the JMP community.   :microphone:  Talks: Combination of MSA and DOE for developing new metrology technologies and optimizing the system & algorithms - John Linden, Physicist at KLA-TENCOR CORPORATION. Adapting Design of Experiments (DOE) to Enhance Device Performance in RIE Fabrication at SCD - Guy Burshtein, Senior R&D Engineer at SCD. :three_o_clock:  When: Tuesday, November 4th | 11:00 - 12:30 IST :globe_with_meridians:  Where: Online :direct_hit:  Who should attend: JMP users of all levels, data enthusiasts, and anyone interested in analytics and data visualization. If you’ve already registered, your spot is secured—no need to re-register. If you haven’t signed up yet, now’s the perfect time!   Looking forward to seeing you there!   Registration link: https://www.jmp.com/en/events/europe/users-groups/2025/israel ... View more