I have a dataset where devices are identified by lot, wafer, and die; and each part may have multiple tests. I can search the test date column to find when the last test was run on each die, I then need to know from the pass_fail column what the status of the last test was, something like:
:PASS_FAIL[ row of Col Maximum(:TEST DATE, :LOTID, :WAFER, :DIE)]
I am hoping for a formula that I can use in Graph Build to generate pass/fail wafer maps based on the state of the last test for each die.