How to insert a loop into SQL which is used in a JSL script?

[#1]

Hi,

I have a need to collect chip-level parametric test data from final testers for many productionwafers.

Each wafer has ~ 3000 chips and 10s of parameters.

I have created a dummy SQL for the purpose of this request for assistance:

SELECT 

    I.PRODUCTNR,

    T.TESTUNITNR,

    T.MEASUREMENTPOINTNR,

    T.CREATIONTIME,

T.RESULT_PARAM1,

T.RESULT_PARAM2.

   .

   .

   .

  FROM

    "ITEMS" D,

    "TESTRESULTS" T,

    "TESTRESULTROWS" TRR,

    "TESTROW" TR,

    .

    .

  WHERE I.IDNR               = T.IDNR

  AND T.TESTRESULTNR         = TRR.TESTRESULTNR

  AND TRR.TESTROWIDNR        = TR.TESTROWIDNR

  AND I.LOTIDNR              = L.LOTIDNR

  AND T.VALIDITY             = '1'

AND D.WAFERNR IN

  (

  'WAF43K309A',

  'WAF43K310A',

  'WAF43K311A',

  'WAF43K312A',

  'WAF43K313A',

  'WAF43K314A',

  ., ., ., ., .,

  'WAF43K315A',

  'WAF43K316A',

  'WAF43K317A',

  'WAF43K319A',

  'WAF43K320A',

  'WAF43K321A'

  )

  AND (T.TESTUNITNR LIKE ('HENE%')

  AND TR.VARIABLENAME      IN

  ( 'ACENUM',

  'OFFSET_X_DIFF',

  'OFFSET_Y_DIFF',

  ......)

  GROUP BY ...

If I collect all data for the first wafer listed  ( WAF43K309A), the collection / fetch time is ~ 90 seconds.

If I collect all data for the first 2 wafers listed   (WAF43K309A,WAF43K310A), the collection / fetch time is ~ 4 minutes

If I collect all data for the first 3 wafer listed   (WAF43K309A,WAF43K310A,WAF43K311A), the collection / fetch time is ~ 7 minutes

I am sure you see the problem, the collect / fetch time grows exponentially with the number of wafers.

Sometime I have to do this over the weekend!!

Using the SQL "Union All" operator and collecting data for one wafer at a time, I can retrieve the data using approximately the same amount of time for each wafer.

This is ok if I have only a few wafers in my list.Unfortunately, I quite often need to collect data from several 10s of wafers , even hundreds of wafers.

Using an inner select I could make a listing of the wafers:

e.g.

.....

AND D.WAFERNR IN (

SELECT WAFERNR from ITEM

WHERE TESTDATE > SYSDATE-5)

the resulting wafer list would be:

  WAF43K309A

  WAF43K310A

  WAF43K311A

  WAF43K312A

  WAF43K313A

  WAF43K314A

  WAF43K315A

  WAF43K316A

  WAF43K317A

  WAF43K319A

  WAF43K320A

  WAF43K321A

Is it possible, using JSL, to use this listing by looping thru the list and collecting data for one wafer at a time?

Looking forward to seeing what creative solutions the community may have to offer

A solution would be a great Christmas present

Best Regards,

Philip

[#2]

Hi Yosef,

Thank you for your input.

I like the way in which you built the list for use in SQL scripts and am sure that I can use it when the need arises.

In this particular case, the idea is to avoid the use of a wafer list in the SQL as it slows down the data acquisition when compared to the one wafer-at-a-time approach.

Best Regards,

Philip