Hi,
I have a need to collect chip-level parametric test data from final testers for many productionwafers.
Each wafer has ~ 3000 chips and 10s of parameters.
I have created a dummy SQL for the purpose of this request for assistance:
SELECT
I.PRODUCTNR,
T.TESTUNITNR,
T.MEASUREMENTPOINTNR,
T.CREATIONTIME,
T.RESULT_PARAM1,
T.RESULT_PARAM2.
.
.
.
FROM
"ITEMS" D,
"TESTRESULTS" T,
"TESTRESULTROWS" TRR,
"TESTROW" TR,
.
.
WHERE I.IDNR = T.IDNR
AND T.TESTRESULTNR = TRR.TESTRESULTNR
AND TRR.TESTROWIDNR = TR.TESTROWIDNR
AND I.LOTIDNR = L.LOTIDNR
AND T.VALIDITY = '1'
AND D.WAFERNR IN
(
'WAF43K309A',
'WAF43K310A',
'WAF43K311A',
'WAF43K312A',
'WAF43K313A',
'WAF43K314A',
., ., ., ., .,
'WAF43K315A',
'WAF43K316A',
'WAF43K317A',
'WAF43K319A',
'WAF43K320A',
'WAF43K321A'
)
AND (T.TESTUNITNR LIKE ('HENE%')
AND TR.VARIABLENAME IN
( 'ACENUM',
'OFFSET_X_DIFF',
'OFFSET_Y_DIFF',
......)
GROUP BY ...
If I collect all data for the first wafer listed ( WAF43K309A), the collection / fetch time is ~ 90 seconds.
If I collect all data for the first 2 wafers listed (WAF43K309A,WAF43K310A), the collection / fetch time is ~ 4 minutes
If I collect all data for the first 3 wafer listed (WAF43K309A,WAF43K310A,WAF43K311A), the collection / fetch time is ~ 7 minutes
I am sure you see the problem, the collect / fetch time grows exponentially with the number of wafers.
Sometime I have to do this over the weekend!!
Using the SQL "Union All" operator and collecting data for one wafer at a time, I can retrieve the data using approximately the same amount of time for each wafer.
This is ok if I have only a few wafers in my list.Unfortunately, I quite often need to collect data from several 10s of wafers , even hundreds of wafers.
Using an inner select I could make a listing of the wafers:
e.g.
.....
AND D.WAFERNR IN (
SELECT WAFERNR from ITEM
WHERE TESTDATE > SYSDATE-5)
the resulting wafer list would be:
WAF43K309A
WAF43K310A
WAF43K311A
WAF43K312A
WAF43K313A
WAF43K314A
WAF43K315A
WAF43K316A
WAF43K317A
WAF43K319A
WAF43K320A
WAF43K321A
Is it possible, using JSL, to use this listing by looping thru the list and collecting data for one wafer at a time?
Looking forward to seeing what creative solutions the community may have to offer
A solution would be a great Christmas present
Best Regards,
Philip