@XiangCD_MP_User ,
Hello. I started, but haven't finished a blog with the goal to demonstrate the usefulness of Process History Explorer.
A large portion of my experience is with semiconductor manufacturing. One excurison that is trivial to find with this platform is a scenario where a tool or chamber is adding defects, a metrology tool, or clean station, etc. A manufacturing process (or production line) often uses a tool for multiple steps. If a batch (lot) of materials never use that tool, it will not have the hunted defect. However, that defect count will be larger the more times the bad tool is used. This can be trivially found using Process History.
If you have not read through the JMP documentation examples, I recommend you do so. It finds patterns of tool usage, period of time, tool-time periods that might be the culprits of differing/unexpected results. These types of patterns can be found with other analyses, tree based and feature set analyses, SVM (support vector machines), etc. IMO, by specifying the required fields in this platform, JMP must be doing the internal data reorganizing to perform specific analyses, trying to answer common process questions. Thus, this platform saves the user a lot of time, if the pattern you are looking for is one that this platform tries to find, and your data table has relevant information.
Your question has motivated me to find time to finish my write-up. Good luck!
