Hello,
I'm looking for the detailed formula of the Gage R&R study which isn't described in the document "JMP Quality & Process Methods".
Someone knows on which basis this analysis is defined, and which formula this is?
Example: I have an optical high resolution measurement system, measuring 5 different products each 10 times in an automated cycle repetition (moving the axis forward and backwards stopping the axis in front of the measurement system, measuring, than again moving backwards, forwards, stopping in front of the measurement system, 10 times, than next product ingressed).
Using the measurement system analysis "Gauge R&R" in JMP with 6sigma as setting and a specific tolerance field USL - LSL:
Thanks,
Michel