Good Afternoon Mr. txnelson,
I thought i might reach out to you here instead of creating a new thread. I am needing some assistance calculating yields and generating a pick list / wafer map using the output table from the script you provided deleting the duplicate data. I looked through the community forums and found a post that was started back in 2016 from what i can see. It is somewhat confusing and hard to follow with all the output variables and such. I haved attached the tables that are the final output.
I have tried using split, stack, tabulate, summary and can't seem to come up with a solution. I actually have two separate tables that are identical except for a column named :trmode. As i mentioned i am trying to run yield analysis and then create a pick list and a wafer map.. I actually have another test_output table that i am currently working on using the tools that you fine gentlemen have provided to me..
dummy_data_tx: test_output have spec limits of (LSL = 20 and USL = 40) for each channel
dummy_data_rx: test_output have spec limits of (LSL = 15 and USL = 35) for each channel
dummy_data_dc: test_output have spec limits of- (actually having issues with deleting the duplicate data with this test..
set_id (7000) - VDD_Dig (LSL = 0.03 and USL = 0.06)
set_id (7100) - VDD_Dig (LSL = 0.03 and USL = 0.06)
set_id (7200) - VDD_Dig (LSL = 0.03 and USL = 0.06)
Any assistance you can give me again, is greatly appreciated..
set_id (7000) - ANALOG (LSL = 0.03 and USL = 0.07)
set_id (7100) - VDD_Dig (LSL = 0.2 and USL = 1)
set_id (7200) - VDD_Dig (LSL = 0.15 and USL = 0.35)