Life got you down? Do you have two failure modes and you're not sure how to make reliability predictions? There is a path to success! Using a straightforward method, an Arrhenius data set of transistor lifetimes with two independent, lognormal failure mechanisms are modeled in JMP. The upper confidence bound on the probability of failure at use conditions is also estimated. 

But what about future testing? You may need to test similar parts in the next qualification. How should you design your life tests when there is more than one failure mode? Again, there is a solution!  A graphical method for planning life tests with two independent, lognormal failure mechanisms is demonstrated. Reliability estimates from simulated bimodal data are shown with the contour profiler, helping you navigate this difficulty. This simple graphical approach allows the practitioner to choose test conditions that have the best chance of meeting the desired reliability goal.