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ITEA Presentation - Pass-Fail Test Data

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Reanalysis of Pass-Fail Detector Test Data Using DOE and

Monte Carlo Simulation of an Analog Response to Reduce the Number of Tests

First presented in January 2011 at the International Test and Evaluation Association (ITEA) System of Systems Engineering Workshop. All slides are attached at the bottom of the page.  Two sample slides are shown below.

7899_ITEA P(d) Shielding G.jpg

7900_ITEA Monte Carlo 1800.jpg

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