Inventors
King, C.B., Lekivetz, R.A., Morgan, J.A., Saanchi, Y. and Jones, B.A.
Patent Number
U.S. Patent 11,854,127
Date Granted
10/26/2023
Description
A computing device receives a target value for a design quality metric. The target value indicates a desired quality of a design of an experiment and is related to an input parameter by a response curve. The computing device also validates the target value as being in a feasibility range for the design quality metric, and if so, determines a candidate value for the input parameter that yields a calculated value for the design quality metric. To determine the calculated value, the computing device iteratively adjusts the candidate value until the calculated value is within a predetermined tolerance of the target value. The computing device then updates an interactive graph visually representing the calculated value for the design quality metric as a function of the candidate value for the input parameter and outputs a graph visually representing the relationship that exists between the candidate value and the calculated value.