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  • DownloadSemiconductor Toolkit: Tools to create wafer maps, add wafer geometry to graphics, explore die defects & compare wafers.
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Learning Resources

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Collecting Data

This Analysis Guide provides a list of potential questions that one might consider when trying to determine how much data to collect. For example – in designing an experiment. There are many statistical techniques useful in addressing these questions which are listed in the second column. The JMP® platforms that provide access to those statistical techniques along with One Page Step-by-Step Guides included in this manual are highlighted in the third column.

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