Webinar: From Defect to Root Cause: Making Sense of Semiconductor Data
JMP is teaming up with Physics Today and Wiley for a webinar featuring two speakers with firsthand semiconductor industry experience.
Lisa Daroque and Christian Zollner will share insights from their work in the industry, using a real-life case study to show how data analysis can help trace a fab defect to its potential root cause.
Registration: From Defect to Root Cause: Making Sense of Semiconduc...