Post-Processing and Getting Insight from Spectral Data

Do you face challenges with restrictive data formats from EDS, XRD, or Raman instruments? Are the exported spectra and reports too static, offering little flexibility for customization or deeper analysis? Do you need tools that allow flexible peak detection, baseline correction, background subtraction, and high-quality figure generation for peer review and presentations?

JMP enables researchers to move beyond static instrument outputs by importing raw data for full reformatting, cleaning, and advanced analysis.

In this session, see how to:

• Restructure and explore datasets to identify hidden patterns and outliers.
• Apply baseline correction, smoothing, normalization, and background subtraction to isolate true signals.
• Detect and resolve overlapping peaks in noisy regions using robust algorithms.
• Generate high-resolution, publication-ready plots with complete control of labels, annotations, and formatting.

Suggested Prerequisites:

• Basic familiarity with accessing and using spectral data (EDS, XRD, Raman) or other curved data
• Familiarity with basic JMP menus and analyses